on-die IR/voltage-droop reduction from backside power (Intel PowerVia test chip), ~6% freq at iso-power
~30%observed
| Value kind | observed — Reported measurements, counts, and specifications keep the precision and scope stated by their source; an exact specification is not treated as a range. |
|---|---|
| Scope | backside-power droop cut |
| As of | 2025 |
| Source | Intel PowerVia / SemiEngineering · “How We Are Doing It”; reports more than 30% platform voltage-droop improvement and a 6% frequency benefit |
| Review | checking…review by 2026-10-25 · slow cadence |
| Recorded changes | last 2026-06-29 |
| Claim id | on-die-ir-voltage-droop-reduction-from-backside |
Where the guide uses it
← Full numbers register — every date-stamped figure in the guide, with revision history.